Design For Test Achieves Significant Economic Payback

• Develop singular test philosophy across all life cycle phases supported by a methodology using commercial tools
• Introduce DFT as early as possible to reduce cost/time for test at all life cycle phases
• Develop ABIST and BSCAN tools (LV Software) that can support board design

BENEFITS

• Consolidated requirements set maximize reuse to minimize test development costs
• Reduce project life cycle test cost by 2.3X
• Reduce cost of test in manufacturing by 2.7X
• Reduce product life cycle cost up to 20%
• Standardized reusable test strategies and testability building blocks enhance reuse

• Effectiveness of DFT tools demonstrated during application to BM projects
  • Early high level DFT entry, architecture tradeoffs
  • DFT requirements, STP, test architecture, Test Strategy Diagram (TSD) developed and applied
• Generation of Reuse Elements which reduce LCC (Template Procedures)
• Publication of Methodology and its enablers (Ver. 1 - 9/95)
  • DFT training developed/available
  • Complete formal documentation of DFT topics and results (6/96 to 6/97)
  • Templates, reusable testbench, and components published on Lockheed Martin EPI Web

• Worked with Lockheed Martin EPI Center on common approach
• RASSP DFT accepted as Lockheed Martin EPI Best Practice
• LV Software RASSP BAA completed under Lockheed Martin ATL prime contract